T.M. Chen

Noise in Ru-based thick-film resistors

T.M. Chen, Sy-Haur Su, David Smith · Solid-State Electronics · 1982 · 27 citations

Engineering, Electrical Engineering, Materials Science +12

An Ultrasensitive and Broad‐Spectrum MoS₂ Photodetector with Extrinsic Response Using Surrounding Homojunction

Jiaqi Zhu, Yufeng Shan, Changlong Liu et al. · Advanced Science · 2024 · 23 citations · Full text

Engineering, Materials Engineering, Materials Science +17

A comparison between noise measurements and conventional electromigration reliability testing

J.G. Cottle, T.M. Chen, Kenneth P. Rodbell · 2003 · 13 citations

Engineering, Electrical Engineering, Materials Science +17

Physical model of burst noise in thick-film resistors

T.M. Chen, J.G. Cottle · Solid-State Electronics · 1986 · 10 citations

Engineering, Electrical Engineering, Physics +16

Resistance drift noise in high Tc superconducting transition region bolometers

J. Hall, Heather D. Hickman, T.M. Chen · Solid State Communications · 1990 · 10 citations

Natural Sciences, Electrical Engineering, Physics +13