T. J. J. Ho

Reassessing the Mechanisms of Negative-Bias Temperature Instability by Repetitive Stress/Relaxation Experiments

D. S. Ang, Z. Q. Teo, T. J. J. Ho et al. · IEEE Transactions on Device and Materials Reliability · 2010 · 67 citations

Engineering, Electrical Engineering, Electronic Materials +14

Are Interface State Generation and Positive Oxide Charge Trapping Under Negative-Bias Temperature Stressing Correlated or Coupled?

T. J. J. Ho, D. S. Ang, A. A. Boo et al. · IEEE Transactions on Electron Devices · 2012 · 22 citations

Natural Sciences, Materials Science, Physics +17

Effect of Hole-Trap Distribution on the Power-Law Time Exponent of NBTI

D. S. Ang, Simon Chung Sing Lai, G. A. Du et al. · IEEE Electron Device Letters · 2009 · 21 citations

Engineering, Electrical Engineering, Physics +17