G. A. Du

A Consistent Deep-Level Hole Trapping Model for Negative Bias Temperature Instability

D. S. Ang, S. Wang, G. A. Du et al. · IEEE Transactions on Device and Materials Reliability · 2008 · 59 citations

Electrical Engineering, Engineering, Physics +13

Ultrafast Measurement on NBTI

G. A. Du, D. S. Ang, Z. Q. Teo et al. · IEEE Electron Device Letters · 2009 · 48 citations

Nbti Characterization, Engineering, Vlsi Design +19

ReRAM Technologies for Embedded Memory and Further Applications

Satoru Ito, Yukio Hayakawa, Zhiqiang Wei et al. · 2018 · 35 citations

Electrical Engineering, Engineering, Microfabrication +11

Effect of Hole-Trap Distribution on the Power-Law Time Exponent of NBTI

D. S. Ang, Simon Chung Sing Lai, G. A. Du et al. · IEEE Electron Device Letters · 2009 · 21 citations

Device Modeling, Power-law Time Exponent, Electrical Engineering +15

Effect of Nitrogen on the Frequency Dependence of Dynamic NBTI-Induced Threshold-Voltage Shift of the Ultrathin Oxynitride Gate P-MOSFET

S. Wang, D. S. Ang, G. A. Du · IEEE Electron Device Letters · 2008 · 11 citations

Semiconductor Technology, Electrical Engineering, Engineering +13