A. A. Boo

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Active since

2011

Affiliations

Nanyang Technological University(Current)

GlobalFoundries (Singapore)

A. A. Boo is an author at Nanyang Technological University specializing in negative bias temperature instability, semiconductor reliability, and defects in electronic materials.

Publications per year

2011–2012

Publications

Are Interface State Generation and Positive Oxide Charge Trapping Under Negative-Bias Temperature Stressing Correlated or Coupled?

T. J. J. Ho, D. S. Ang, A. A. Boo et al. · IEEE Transactions on Electron Devices · 2012 · 22 citations

Natural Sciences, Materials Science, Physics +17

Correlation Between Oxide Trap Generation and Negative-Bias Temperature Instability

A. A. Boo, D. S. Ang, Z. Q. Teo et al. · IEEE Electron Device Letters · 2012 · 19 citations

Engineering, Electrical Engineering, Materials Science +14

On the evolution of the recoverable component of the SiON, HfSiON and HfO<inf>2</inf> P-MOSFETs under dynamic NBTI

Yuan Gao, A. A. Boo, Z. Q. Teo et al. · 2011 · 19 citations

Engineering, Electrical Engineering, Microelectronics +15

On the cyclic threshold voltage shift of dynamic negative-bias temperature instability

Z. Q. Teo, A. A. Boo, D. S. Ang et al. · 2011 · 18 citations

Engineering, Electrical Engineering, Physics +17

Evolution of Hole Trapping in the Oxynitride Gate p-MOSFET Subjected to Negative-Bias Temperature Stressing

A. A. Boo, D. S. Ang · IEEE Transactions on Electron Devices · 2012 · 15 citations

Engineering, Electrical Engineering, Materials Science +17

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