A. R. Chourasia

Growth of diamond films and characterization by Raman, scanning electron microscopy, and x-ray photoelectron spectroscopy

S. C. Sharma, M. Green, R. C. Hyer et al. · Journal of materials research/Pratt's guide to venture capital sources · 1990 · 58 citations

Materials Science, Engineering, Electron Microscopy +7

X-ray photoelectron study of TiN/SiO2 and TiN/Si interfaces

A. R. Chourasia, D. Chopra · Thin Solid Films · 1995 · 46 citations

Materials Science, Engineering, Oxide Electronics +4

A study of CrNx thin films by X-ray photoelectron spectroscopy

Christi Emery, A. R. Chourasia, P. Yashar · Journal of Electron Spectroscopy and Related Phenomena · 1999 · 41 citations

Materials Science, Material Analysis, X-ray Spectroscopy +6

X-Ray Photoemission Study of the Oxidation of Hafnium

A. R. Chourasia, John Hickman, Richard L. Miller et al. · International Journal of Spectroscopy · 2008 · 31 citations · Full text

Materials Engineering, Materials Science, Deposited Overlayer +11

Deposition of diamond films at low pressures and their characterization by positron annihilation, Raman, scanning electron microscopy, and x-ray photoelectron spectroscopy

S. C. Sharma, C. A. Dark, R. C. Hyer et al. · Applied Physics Letters · 1990 · 24 citations

Materials Science, Semiconductors, Positron Annihilation +15