A. R. Chourasia - Concepedia

Author

A. R. Chourasia

East Texas A&M University ORCID

Also Known As

A R Chourasia, A. R. Chourasia, A.R Chourasia, A.R. Chourasia, Anil Chourasia, Anil R. Chourasia

Publications

529

Citations

H-Index

Concepts

All Affiliations

East Texas A&M University Texas State University The University of Texas at Arlington

About

A. R. Chourasia is an author at East Texas A&M University specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	18	400
2	Applied Physics	12	14	339
3	Chemistry	7	7	116
4	Natural Sciences	4	4	54
5	Electrical Engineering	1	1	18

A. R. Chourasia

Publications

410

Citations

H-Index

Page 1

	Year	Citations
Growth of diamond films and characterization by Raman, scanning electron microscopy, and x-ray photoelectron spectroscopy S. C. Sharma, M. Green, R. C. Hyer, Journal of materials research/Pratt's guide to venture capital sources Materials ScienceEngineeringElectron MicroscopyNanomaterialsCrystal Growth Technology	1990	58
X-ray photoelectron study of TiN/SiO2 and TiN/Si interfaces A. R. Chourasia, D. Chopra Thin Solid Films Materials ScienceEngineeringOxide ElectronicsApplied PhysicsSemiconductor Material	1995	46
A study of CrNx thin films by X-ray photoelectron spectroscopy Christi Emery, A. R. Chourasia, P. Yashar Journal of Electron Spectroscopy and Related Phenomena Materials ScienceMaterial AnalysisX-ray SpectroscopyEngineeringX-ray Diffraction	1999	41
X-Ray Photoemission Study of the Oxidation of Hafnium A. R. Chourasia, John Hickman, Richard L. Miller, International Journal of Spectroscopy Materials EngineeringMaterials ScienceDeposited OverlayerMaterial AnalysisEngineering	2008	31
Deposition of diamond films at low pressures and their characterization by positron annihilation, Raman, scanning electron microscopy, and x-ray photoelectron spectroscopy S. C. Sharma, C. A. Dark, R. C. Hyer, Applied Physics Letters Materials ScienceSemiconductorsPositron AnnihilationEngineeringElectron Microscopy	1990	24
X-ray Photoelectron Study of TiN A. R. Chourasia, D. Chopra Surface Science Spectra Materials EngineeringMaterials ScienceThin Film PhysicsEngineeringSurface Science	1992	21
Core Level XPS Spectra of Silicon Carbide Using Zirconium and Magnesium Radiations A. R. Chourasia Surface Science Spectra Materials EngineeringMaterials ScienceNuclear CeramicX-ray SpectroscopyEngineering	2001	21
Surface Characterization G. E. McGuire, M. L. Swanson, N.R. Parikh, Analytical Chemistry AltmetricsEngineeringInformationMass SpectrometryQuantitative Analysis	1995	21
Characterization of low pressure deposited diamond films by X-ray photoelectron spectroscopy A. R. Chourasia, D. Chopra, S. C. Sharma, Thin Solid Films Materials ScienceX-ray SpectroscopyEngineeringX-ray DiffractionApplied Physics	1990	19
Scanning tunneling microscopy of the electronic structure of chemical vapor deposited diamond films J.M. Pérez, Chun‐Yu Lin, W. Rivera, Applied Physics Letters EngineeringElectronic StructurePlasma ElectronicsTunneling MicroscopyNanoelectronics	1993	18

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