Publication | Closed Access
X-ray photoelectron study of TiN/SiO2 and TiN/Si interfaces
46
Citations
15
References
1995
Year
Materials ScienceEngineeringOxide ElectronicsApplied PhysicsSemiconductor MaterialSilicon On InsulatorX-ray Photoelectron Study
| Year | Citations | |
|---|---|---|
Page 1
Page 1