D. Chopra

Growth of diamond films and characterization by Raman, scanning electron microscopy, and x-ray photoelectron spectroscopy

S. C. Sharma, M. Green, R. C. Hyer et al. · Journal of materials research/Pratt's guide to venture capital sources · 1990 · 58 citations

Natural Sciences, Materials Engineering, Materials Science +10

X-ray photoelectron study of TiN/SiO2 and TiN/Si interfaces

A. R. Chourasia, D. Chopra · Thin Solid Films · 1995 · 46 citations

Natural Sciences, Materials Engineering, Materials Science +14

Deposition of diamond films at low pressures and their characterization by positron annihilation, Raman, scanning electron microscopy, and x-ray photoelectron spectroscopy

S. C. Sharma, C. A. Dark, R. C. Hyer et al. · Applied Physics Letters · 1990 · 24 citations

Natural Sciences, Materials Science, Physics +16

X-ray Photoelectron Study of TiN

A. R. Chourasia, D. Chopra · Surface Science Spectra · 1992 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +12

X-Ray Spectrometric Characteristics of Potassium Acid Phthalate Crystals

D. Chopra · Review of Scientific Instruments · 1970 · 21 citations

Natural Sciences, Chemistry, Analytical Chemistry +13