R. C. Hyer

Growth of diamond films and characterization by Raman, scanning electron microscopy, and x-ray photoelectron spectroscopy

S. C. Sharma, M. Green, R. C. Hyer et al. · Journal of materials research/Pratt's guide to venture capital sources · 1990 · 58 citations

Materials Science, Engineering, Electron Microscopy +7

Composites of polypyrrole and carbon black: Part III. Chemical synthesis and characterization

Wesley A. Wampler, Krishnan Rajeshwar, R.G. Pethe et al. · Journal of materials research/Pratt's guide to venture capital sources · 1995 · 37 citations

Materials Science, Chemical Engineering, Engineering +9

Deposition of diamond films at low pressures and their characterization by positron annihilation, Raman, scanning electron microscopy, and x-ray photoelectron spectroscopy

S. C. Sharma, C. A. Dark, R. C. Hyer et al. · Applied Physics Letters · 1990 · 24 citations

Materials Science, Semiconductors, Positron Annihilation +15

Characterization of low pressure deposited diamond films by X-ray photoelectron spectroscopy

A. R. Chourasia, D. Chopra, S. C. Sharma et al. · Thin Solid Films · 1990 · 19 citations

Materials Science, X-ray Spectroscopy, Engineering +7

Scanning tunneling microscopy of the electronic structure of chemical vapor deposited diamond films

J.M. Pérez, Chun‐Yu Lin, W. Rivera et al. · Applied Physics Letters · 1993 · 18 citations · Full text

Engineering, Electronic Structure, Plasma Electronics +20