Wan-Lin Chung

Liquid Structure and the Ion-Ion Interactions of Ethylammonium Nitrate Ionic Liquid Studied by Large Angle X-Ray Scattering and Molecular Dynamics Simulations

Yasuhiro Umebayashi, Wan-Lin Chung, Takushi Mitsugi et al. · Journal of Computer Chemistry Japan · 2008 · 108 citations · Full text

Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu et al. · Applied Physics Letters · 2011 · 36 citations · Full text

Device Modeling, Electrical Engineering, Engineering +12

On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs

Chih-Hao Dai, Ting‐Chang Chang, A. K. Chu et al. · IEEE Electron Device Letters · 2011 · 19 citations

Semiconductors, Device Modeling, Electrical Engineering +12

Impact of Mechanical Strain on GIFBE in PD SOI p-MOSFETs as Indicated From NBTI Degradation

Wen-Hung Lo, Ting‐Chang Chang, Chih-Hao Dai et al. · IEEE Electron Device Letters · 2012 · 17 citations

Materials Engineering, Electrical Engineering, Strained Fb Device +13