Chih-Hao Dai - Concepedia

Author

Chih-Hao Dai

National Sun Yat-sen University

Also Known As

C.H. Dai, Chih-Hao Dai

Publications

215

Citations

H-Index

Concepts

All Affiliations

National Sun Yat-sen University National Yang Ming Chiao Tung University United Microelectronics (Taiwan)University of British Columbia

About

Chih-Hao Dai is an author at National Sun Yat-sen University specializing in engineering, applied physics, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	9	9	203
2	Applied Physics	8	8	189
3	Electrical Engineering	7	7	147
4	Materials Engineering	1	1	17
5	Materials Science	1	1	42

Chih-Hao Dai

Publications

203

Citations

H-Index

Page 1

	Year	Citations
NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain Chia-Sheng Lin, Ying-Chung Chen, Ting‐Chang Chang, IEEE Electron Device Letters EngineeringMechanical EngineeringNbti StressSemiconductor DeviceStressstrain Analysis	2011	42
Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu, Applied Physics Letters Device ModelingElectrical EngineeringEngineeringNanoelectronicsElectronic Engineering	2011	36
Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu, Applied Physics Letters Electrical EngineeringEngineeringNanoelectronicsStress-induced Leakage CurrentBias Temperature Instability	2011	25
On the Origin of Hole Valence Band Injection on GIFBE in PD SOI n-MOSFETs Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu, IEEE Electron Device Letters Electrical EngineeringBody TerminalEngineeringRf SemiconductorPhysics	2010	23
On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs Chih-Hao Dai, Ting‐Chang Chang, A. K. Chu, IEEE Electron Device Letters SemiconductorsDevice ModelingElectrical EngineeringSemiconductor TechnologyEngineering	2011	19
Impact of Mechanical Strain on GIFBE in PD SOI p-MOSFETs as Indicated From NBTI Degradation Wen-Hung Lo, Ting‐Chang Chang, Chih-Hao Dai, IEEE Electron Device Letters Materials EngineeringElectrical EngineeringStrained Fb DeviceEngineeringNanoelectronics	2012	17
Enhanced gate-induced floating-body effect in PD SOI MOSFET under external mechanical strain Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu, Surface and Coatings Technology EngineeringMechanical EngineeringMicroelectronicsGate-induced Floating-body EffectExternal Mechanical Strain	2010	14
Substrate current enhancement in 65 nm metal-oxide-silicon field-effect transistor under external mechanical stress Yu‐Sheng Kuo, Ting-Hsuan Chang, Ping‐Hung Yeh, Thin Solid Films Electrical EngineeringEngineeringMicrofabricationNanoelectronicsStress-induced Leakage Current	2008	14
Charge trapping induced drain-induced-barrier-lowering in HfO2/TiN p-channel metal-oxide-semiconductor-field-effect-transistors under hot carrier stress Wen-Hung Lo, Ting‐Chang Chang, Jyun-Yu Tsai, Applied Physics Letters Electrical EngineeringEngineeringNanoelectronicsSaturation RegionStress-induced Leakage Current	2012	13

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