Yuan-Jui Kuo

NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain

Chia-Sheng Lin, Ying-Chung Chen, Ting‐Chang Chang et al. · IEEE Electron Device Letters · 2011 · 42 citations

Engineering, Mechanical Engineering, Nbti Stress +17

Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu et al. · Applied Physics Letters · 2011 · 36 citations · Full text

Device Modeling, Electrical Engineering, Engineering +12

Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu et al. · Applied Physics Letters · 2011 · 25 citations

Electrical Engineering, Engineering, Nanoelectronics +10

On the Origin of Hole Valence Band Injection on GIFBE in PD SOI n-MOSFETs

Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu et al. · IEEE Electron Device Letters · 2010 · 23 citations

Electrical Engineering, Body Terminal, Engineering +12

On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs

Chih-Hao Dai, Ting‐Chang Chang, A. K. Chu et al. · IEEE Electron Device Letters · 2011 · 19 citations

Semiconductors, Device Modeling, Electrical Engineering +12