Wen-Hung Lo - Concepedia

Author

Wen-Hung Lo

National Sun Yat-sen University

Also Known As

Wen-Hung Lo, Wen-hung Lo, Wen‐Hung Lo

Publications

218

Citations

H-Index

Concepts

All Affiliations

National Sun Yat-sen University National Yang Ming Chiao Tung University United Microelectronics (Taiwan)University of British Columbia

About

Wen-Hung Lo is an author at National Sun Yat-sen University specializing in engineering, applied physics, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	8	8	189
2	Applied Physics	7	7	175
3	Electrical Engineering	6	6	133
4	Materials Engineering	1	1	17
5	Materials Science	1	1	42

Wen-Hung Lo

Publications

204

Citations

H-Index

Page 1

	Year	Citations
NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain Chia-Sheng Lin, Ying-Chung Chen, Ting‐Chang Chang, IEEE Electron Device Letters EngineeringMechanical EngineeringNbti StressSemiconductor DeviceStressstrain Analysis	2011	42
Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu, Applied Physics Letters Device ModelingElectrical EngineeringEngineeringNanoelectronicsElectronic Engineering	2011	36
Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu, Applied Physics Letters Electrical EngineeringEngineeringNanoelectronicsStress-induced Leakage CurrentBias Temperature Instability	2011	25
On the Origin of Hole Valence Band Injection on GIFBE in PD SOI n-MOSFETs Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu, IEEE Electron Device Letters Electrical EngineeringBody TerminalEngineeringRf SemiconductorPhysics	2010	23
On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs Chih-Hao Dai, Ting‐Chang Chang, A. K. Chu, IEEE Electron Device Letters SemiconductorsDevice ModelingElectrical EngineeringSemiconductor TechnologyEngineering	2011	19
Impact of Mechanical Strain on GIFBE in PD SOI p-MOSFETs as Indicated From NBTI Degradation Wen-Hung Lo, Ting‐Chang Chang, Chih-Hao Dai, IEEE Electron Device Letters Materials EngineeringElectrical EngineeringStrained Fb DeviceEngineeringNanoelectronics	2012	17
33.1L: <i>Late‐News Paper</i> : High Resolution 4.4” AMOLED Display with 413 ppi Real Pixel Density Chung‐Chia Chen, Ting‐Yi Cho, Jing‐Jie Fu, SID Symposium Digest of Technical Papers	2013	15
Enhanced gate-induced floating-body effect in PD SOI MOSFET under external mechanical strain Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu, Surface and Coatings Technology EngineeringMechanical EngineeringMicroelectronicsGate-induced Floating-body EffectExternal Mechanical Strain	2010	14
Charge trapping induced drain-induced-barrier-lowering in HfO2/TiN p-channel metal-oxide-semiconductor-field-effect-transistors under hot carrier stress Wen-Hung Lo, Ting‐Chang Chang, Jyun-Yu Tsai, Applied Physics Letters Electrical EngineeringEngineeringNanoelectronicsSaturation RegionStress-induced Leakage Current	2012	13

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