D. Barge

28nm FDSOI technology platform for high-speed low-voltage digital applications

N. Planes, O. Weber, V. Barral et al. · 2012 · 424 citations

Engineering, Computer Engineering, Electrical Engineering +16

New characterization and modeling approach for NBTI degradation from transistor to product level

V. Huard, C. Parthasarathy, N. Rallet et al. · 2007 · 95 citations

Engineering, Computer Engineering, Electrical Engineering +17

14nm FDSOI technology for high speed and energy efficient applications

O. Weber, E. Josse, F. Andrieu et al. · 2014 · 89 citations

Engineering, Computer Engineering, Electrical Engineering +15

Fully-depleted SOI technology using high-k and single-metal gate for 32 nm node LSTP applications featuring 0.179 μm² 6T-SRAM bitcell

C. Fenouillet-Béranger, J. Todeschini, Jean-Christophe Le-Denmat et al. · 2007 · 61 citations

Engineering, Computer Engineering, Electrical Engineering +15

New insights on bottom layer thermal stability and laser annealing promises for high performance 3D VLSI

C. Fenouillet-Béranger, B. Mathieu, B. Prévitali et al. · 2014 · 56 citations

Engineering, Electrical Engineering, Materials Science +17