Ulrike Kindereit

Quantitative Investigation of Laser Beam Modulation in Electrically Active Devices as Used in Laser Voltage Probing

Ulrike Kindereit, Gary Woods, Jing Tian et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 64 citations

Engineering, Backside Analysis Techniques, Laser Beam Modulation +19

Fundamentals and future applications of Laser Voltage Probing

Ulrike Kindereit · 2014 · 37 citations

Photonics, Electrical Engineering, Electronic Instrumentation +13

Investigation of Laser Voltage Probing Signals in CMOS Transistors

Ulrike Kindereit, Gary Woods, Jing Tian et al. · 2007 · 21 citations

Engineering, Measurement, Education +16

Physical IC debug – backside approach and nanoscale challenge

Christian Boit, Rudolf Schlangen, A. Glowacki et al. · Advances in radio science · 2008 · 14 citations · Full text

Engineering, Ic Functionality, Integrated Circuits +18

Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology

Ulrike Kindereit, Christian Boit, U. Kerst et al. · Microelectronics Reliability · 2008 · 12 citations

Electrical Engineering, Engineering, Microscopy +11