Y. Hirano

Cooperative research on safety fundamentals of lithium batteries

J. R. Selman, Said Al Hallaj, Isamu Uchida et al. · Journal of Power Sources · 2001 · 92 citations

Electric Battery, Safety Fundamentals, Electrical Engineering +7

Application of a statistical compact model for Random Telegraph Noise to scaled-SRAM Vmin analysis

M. Tanizawa, S. Ohbayashi, T. Okagaki et al. · 2010 · 41 citations

Electrical Engineering, Log-normal Statistics, Engineering +15

Tantalum-gate thin-film SOI nMOS and pMOS for low-power applications

Hiroyuki Shimada, Y. Hirano, T. Ushiki et al. · IEEE Transactions on Electron Devices · 1997 · 37 citations

Electrical Engineering, Engineering, Nanoelectronics +10

Reliable tantalum-gate fully-depleted-SOI MOSFET technology featuring low-temperature processing

T. Ushiki, Mo-Chiun Yu, Y. Hirano et al. · IEEE Transactions on Electron Devices · 1997 · 29 citations

Materials Engineering, Reliable Tantalum, Electrical Engineering +11

Impact of 0.10 μm SOI CMOS with body-tied hybrid trench isolation structure to break through the scaling crisis of silicon technology

Y. Hirano, Takuji Matsumoto, Satoshi Maeda et al. · 2002 · 24 citations

Electrical Engineering, Engineering, Vlsi Design +13