Concepedia

Author

K. Goetz

Friedrich Schiller University Jena

Also Known As

Goetz, K., K Goetz, K. G. Goetz, K. Goetz, K.G. Goetz, Konrad Goetz

27

Publications

608

Citations

10

H-Index

33

Concepts

All Affiliations

Friedrich Schiller University JenaHelmholtz-Zentrum Dresden-Rossendorf
KG

About

K. Goetz is an author at Friedrich Schiller University Jena specializing in engineering, applied physics, and materials science.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

9

9

434

2

Applied Physics

9

9

434

3

Materials Science

9

9

434

4

Materials Engineering

4

4

79

5

Health Sciences

2

2

257

K. Goetz

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10

Publications

444

Citations

10

H-Index

YearCitations

Double crystal diffractometry for the characterization of targets for laser fusion experiments

E. Förster, K. Goetz, P. Zaumseil

Kristall und Technik

1980

223

Remeasurement of characteristic X-ray emission lines and their application to line profile analysis and lattice parameter determination

J. Härtwig, G. Hölzer, E. Förster,

physica status solidi (a)

1994

46

Nanocrystal formation in SiC by Ge ion implantation and subsequent thermal annealing

Ch. Schubert, Ute Kaiser, A. Hedler,

Journal of Applied Physics

2002

41

Measurements of the parameters of shell targets for laser thermonuclear fusion using an x-ray schlieren method

K. Goetz, Mikhail Kalashnikov, Yu. A. Mikhaǐlov,

Soviet Journal of Quantum Electronics

1979

34

Structure refinement of the silicon carbide polytypes 4<i>H</i>and 6<i>H</i>: unambiguous determination of the refinement parameters

A. Bauer, Ph. Reischauer, J. Kräußlich,

Acta Crystallographica Section A Foundations of Crystallography

2001

32

Lattice Parameter Measurements of 3C-SiC Thin Films Grown on 6H-SiC(0001) Substrate Crystals

J. Kräußlich, Anton J. Bauer, B. Wunderlich,

Materials science forum

2001

23

Si/Ge-nanocrystals on SiC(0001)

A. Bauer, J. Kräußlich, A. Fissel,

Thin Solid Films

2000

14

Characterization of silicon carbide surfaces of 6H-, 15R- and 3C-polytypes by optical second-harmonic generation in comparison with X-ray diffraction techniques

Caleb J. C. Jordan, H. Schillinger, L. Dressler,

Applied Physics A

1997

11

X-ray investigations of MBE-grown heteroepitaxial SiC layers on 6H–SiC substrates

Andreas Bauer, J. Kräußlich, B Köcher,

Materials Science and Engineering B

1999

10

Detailed investigations on femtosecond-induced modifications in crystalline quartz for integrated optical applications

Matthias Will, Jonas Burghoff, Stefan Nolte,

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

2005

10

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