Double crystal diffractometry for the characterization of targets for laser fusion experiments

Abstract

Abstract The application of a double‐crystal diffractometer for the production of X‐ray Schlieren topographs is described. The experimental arrangement is optimized on the basis of a wave‐optical description for the investigation of shell targets for laser fusion experiments. The accuracies achieved at the wall thickness measurement of 0.01 … 0.1 μm depending on the series of wall materials and the effort of evaluation fulfil the plasma physical requirements. This opens an important new field of application for the double‐crystal diffractometer.