Remeasurement of characteristic X-ray emission lines and their application to line profile analysis and lattice parameter determination

Abstract

The CuKα and CuKβ emission lines are remeasured with high accuracy. Analytical models of these profiles are obtained by fitting them with sums of n Lorentz functions. The wavelengths of the lines are determined in the metrical system with an accuracy superior to values obtained by other authors. The models are used for the X-ray diffraction line profile analysis of polycrystalline materials and for the determination of lattice parameters with high accuracy. It is proposed to use the independently measured and fitted emission lineshape (wavelength distribution) in X-ray line profile analysis for the modelling of the line profile to improve the conditions for determining the structure parameters of polycrystalline materials. An example for an application is given where the precise measurement of the CuKα emission lineshape is used to analyze molybdenum polycide samples. The lattice parameters of α-Fe whiskers are determined with an accuracy about one or two orders higher than in literature. The values are given also in the metrical system.