J. Kräußlich

Epitaxial relationship in the AlN/Si(001) heterosystem

V. Lebedev, Joerg R. Jinschek, Ute Kaiser et al. · Applied Physics Letters · 2000 · 50 citations

Materials Science, Semiconductors, Aluminium Nitride +12

Analyzer-based phase contrast imaging and phase retrieval using a rotating anode x-ray source

D. J. Vine, David M. Paganin, Konstantin M. Pavlov et al. · Applied Physics Letters · 2007 · 41 citations

Engineering, Microscopy, Phase Contrast Imaging +18

Nanocrystal formation in SiC by Ge ion implantation and subsequent thermal annealing

Ch. Schubert, Ute Kaiser, A. Hedler et al. · Journal of Applied Physics · 2002 · 41 citations

Materials Science, Ion Implantation, Engineering +11

Hexagonal AlN films grown on nominal and off-axis Si(001) substrates

V. Lebedev, Joerg R. Jinschek, J. Kräußlich et al. · Journal of Crystal Growth · 2001 · 41 citations

Materials Engineering, Materials Science, Aluminium Nitride +8

Structure refinement of the silicon carbide polytypes 4<i>H</i>and 6<i>H</i>: unambiguous determination of the refinement parameters

A. Bauer, Ph. Reischauer, J. Kräußlich et al. · Acta Crystallographica Section A Foundations of Crystallography · 2001 · 32 citations

Materials Science, Materials Engineering, Engineering +13