K.R. Koops

Observation of zero creep in piezoelectric actuators

K.R. Koops, P. M. L. O. Scholte, W.L. De Koning · Applied Physics A · 1999 · 28 citations

Engineering, Mechanical Engineering, Mechatronics Engineering +12

Intercomparison of scanning probe microscopes

R Breil, Th. Fries, J Haycocks et al. · Precision Engineering · 2002 · 22 citations

Natural Sciences, Biomedical Engineering, Instrumentation +6

Evaluation of interferometric ellipsometer systems with a time resolution of one microsecond and faster

K. Hemmes, M.A Hamstra, K.R. Koops et al. · Thin Solid Films · 1998 · 17 citations

Natural Sciences, Chemistry, Instrumentation +12

Calibration strategies for scanning probe metrology

K.R. Koops, M G A van Veghel, Gerard Kotte et al. · Measurement Science and Technology · 2007 · 17 citations

Engineering, Mechatronics Engineering, Instrumentation +16

Directional Repetitive Control of a Metrological AFM

Roel Merry, Michael Ronde, René van de Molengraft et al. · IEEE Transactions on Control Systems Technology · 2011 · 10 citations

Engineering, Mechatronics Engineering, Metrology +7