Evaluation of interferometric ellipsometer systems with a time resolution of one microsecond and faster - Concepedia

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Evaluation of interferometric ellipsometer systems with a time resolution of one microsecond and faster

17

Citations

3

References

1998

Year

K. Hemmes, M.A Hamstra, K.R. Koops, M.M. Wind, T. Schram, J. De Laet, H. Bender

Thin Solid Films

EngineeringPhysicsMeasurementCalibrationSpectroscopyNatural SciencesOptical TestingInterferometryTime MetrologyOptical Information ProcessingTime ResolutionInstrumentationOptical EngineeringOptical System AnalysisBiophysicsInterferometric Ellipsometer Systems

References

	Year	Citations

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