J. De Laet

Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry

Alexis Franquet, J. De Laet, T. Schram et al. · Thin Solid Films · 2001 · 99 citations

Materials Science, Surface Characterization, Engineering +8

Development of an optical model for steady state porous anodic films on aluminium formed in phosphoric acid

J. De Laet, Herman Terryn, J. Vereecken · Thin Solid Films · 1998 · 45 citations

Materials Science, Phosphoric Acid, Optical Materials +10

Characterization of various aluminium oxide layers by means of spectroscopic ellipsometry

J. De Laet, Jan Vanhellemont, Herman Terryn et al. · Applied Physics A · 1992 · 38 citations

Materials Science, Aluminium Nitride, Surface Characterization +11

Characterization of aluminium surface treatments with electrochemical impedance spectroscopy and spectroscopic ellipsometry

J. De Laet, Johan Scheers, Herman Terryn et al. · Electrochimica Acta · 1993 · 27 citations

Materials Science, Surface Characterization, Chemical Engineering +11

The use of impedance spectroscopy and optical reflection spectroscopy to study modified aluminium surfaces

J. De Laet, Herman Terryn, J. Vereecken · Electrochimica Acta · 1996 · 25 citations

Materials Science, Surface Characterization, Modified Aluminium Surfaces +10