Publication | Closed Access
Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry
99
Citations
15
References
2001
Year
Materials ScienceSurface CharacterizationEngineeringAluminium SurfacesSurface AnalysisSurface ScienceApplied PhysicsSpectroscopic EllipsometryThin Silane FilmsThin FilmsThin Film Processing
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