P. M. Zagwijn

Batch ALD: Characteristics, comparison with single wafer ALD, and examples

Ernst Granneman, Pamela R. Fischer, Dieter Pierreux et al. · Surface and Coatings Technology · 2007 · 118 citations

Engineering, Materials Engineering, Materials Science +11

A model system for scandate cathodes

P. M. Zagwijn, J.W.M. Frenken, Udo van Slooten et al. · Applied Surface Science · 1997 · 54 citations

Natural Sciences, Chemical Engineering, Electrochemical Engineering +6

Segregation and trapping of erbium during silicon molecular beam epitaxy

R. Serna, M. Lohmeier, P. M. Zagwijn et al. · Applied Physics Letters · 1995 · 47 citations · Full text

Engineering, Materials Engineering, Materials Science +14

The interaction of Sb overlayers with Si(001)

W. F. J. Slijkerman, P. M. Zagwijn, J. F. van der Veen et al. · Surface Science · 1992 · 44 citations

Natural Sciences, Materials Science, Physics +12

Formation of epitaxial β-FeSi2 films on Si(001) as studied by medium-energy ion scattering

K. Konuma, J. Vrijmoeth, P. M. Zagwijn et al. · Journal of Applied Physics · 1993 · 41 citations · Full text

Natural Sciences, Materials Science, Physics +17