Concepedia
Statistics
Publications
4
Citations
83
H-Index
Active since
2015
Affiliations
Université de Bordeaux(Current)
Laboratoire de l'Intégration du Matériau au Système
Institut Polytechnique de Bordeaux
Infineon Technologies (Germany)
University of Naples Federico II
Thomas Jacquet is an author at Université de Bordeaux specializing in microelectronics, engineering, and electrical engineering.
Publications per year
2015–2017
Microscopic Hot-Carrier Degradation Modeling of SiGe HBTs Under Stress Conditions Close to the SOA Limit
Hamed Kamrani, Dominic Jabs, Vincenzo d’Alessandro et al. · IEEE Transactions on Electron Devices · 2017 · 25 citations
Engineering, Electrical Engineering, Materials Engineering +17
Hot-Carrier Degradation in SiGe HBTs: A Physical and Versatile Aging Compact Model
C. Mukherjee, Thomas Jacquet, Gerhard G. Fischer et al. · IEEE Transactions on Electron Devices · 2017 · 24 citations · Full text
Engineering, Electrical Engineering, Materials Science +17
Reliability of high-speed SiGe:C HBT under electrical stress close to the SOA limit
Thomas Jacquet, G. Sasso, Anjan Chakravorty et al. · Microelectronics Reliability · 2015 · 19 citations
Engineering, Electrical Engineering, Materials Science +15
Low-Frequency Noise in Advanced SiGe:C HBTs—Part I: Analysis
C. Mukherjee, Thomas Jacquet, Anjan Chakravorty et al. · IEEE Transactions on Electron Devices · 2016 · 15 citations
Engineering, Electrical Engineering, Microelectronics +16
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