Yutaka Shionoiri

Nonvolatile Memory With Extremely Low-Leakage Indium-Gallium-Zinc-Oxide Thin-Film Transistor

Hiroki Inoue, Takanori Matsuzaki, Shuhei Nagatsuka et al. · IEEE Journal of Solid-State Circuits · 2012 · 99 citations

Evaluation of Off-State Current Characteristics of Transistor Using Oxide Semiconductor Material, Indium–Gallium–Zinc Oxide

Kiyoshi Katō, Yutaka Shionoiri, Yusuke Sekine et al. · Japanese Journal of Applied Physics · 2012 · 96 citations

Engineering, Off-state Current Characteristics, Emerging Memory Technology +18

Evaluation of Off-State Current Characteristics of Transistor Using Oxide Semiconductor Material, Indium–Gallium–Zinc Oxide

Kiyoshi Katō, Yutaka Shionoiri, Yusuke Sekine et al. · Japanese Journal of Applied Physics · 2012 · 95 citations

(Invited) Success in Measurement the Lowest Off-state Current of Transistor in the World

Yusuke Sekine, Kazuma Furutani, Yutaka Shionoiri et al. · ECS Transactions · 2011 · 54 citations

Oxide Semiconductor, Engineering, Measurement +16

DRAM Using Crystalline Oxide Semiconductor for Access Transistors and Not Requiring Refresh for More Than Ten Days

Tomoaki Atsumi, Shuhei Nagatsuka, Hideko Inoue et al. · 2012 · 37 citations

Non-volatile Memory, Engineering, Computer Architecture +17