H. Medecki - Concepedia

Author

H. Medecki

Lawrence Berkeley National Laboratory

Also Known As

H . Medecki, H Medecki, H. M. Medecki, H. MEDECKI, H. Medecki, HECTOR MEDECKI, Hector Medecki

Publications

1.5K

Citations

H-Index

Concepts

All Affiliations

Lawrence Berkeley National Laboratory Lawrence Livermore National Laboratory University of California, Berkeley

About

H. Medecki is an author at Lawrence Berkeley National Laboratory specializing in engineering, instrumentation, and optical properties.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	8	8	1.3K
2	Applied Physics	6	6	1.3K
3	Health Sciences	1	1	12
4	Medicine	1	1	16
5	Natural Sciences	1	1	1K

H. Medecki

Publications

1.4K

Citations

H-Index

Page 1

	Year	Citations
Demonstration of a Soft X-Ray Amplifier D. L. Matthews, Peter L. Hagelstein, M. D. Rosen, Physical Review Letters Soft X-raySoft X-ray WavelengthsX-ray SpectroscopyAmplified Spontaneous EmissionPhysics	1985	1K
Phase-shifting point diffraction interferometer H. Medecki, Edita Tejnil, Kenneth A. Goldberg, Optics Letters PhotonicsNew DesignEngineeringPhysicsOphthalmology	1996	144
Time-resolved x-ray transmission grating spectrometer for studying laser-produced plasmas N. M. Ceglio, R. L. Kauffman, A. M. Hawryluk, Applied Optics	1983	77
Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions David Attwood, Patrick Naulleau, Kenneth A. Goldberg, IEEE Journal of Quantum Electronics X-ray SpectroscopyEngineeringSynchrotron Radiation SourceX-ray ImagingRadiation Generation	1999	52
At-wavelength interferometry for extreme ultraviolet lithography Edita Tejnil, Kenneth A. Goldberg, Sang-Hun Lee, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Short Wavelength OpticOptical MaterialsEngineeringWave FrontOptic Design	1997	39
Characterization of an EUV Schwarzschild objective using phase-shifting point diffraction interferometry Kenneth A. Goldberg, Edita Tejnil, Sang Hun Lee, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Optical MaterialsEngineeringEuv SchwarzschildOptical TestingInterferometry	1997	24
Progress towards λ/20 extreme ultraviolet interferometry Kenneth A. Goldberg, R. Beguiristain, Jeffrey Bokor, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringWave FrontMicroscopyInterferometryOptical Metrology	1995	16
Relative responses of CsI and Au photocathodes to 70-psec, 500-eV x-ray pulses G. L. Stradling, H. Medecki, R. L. Kauffman, Applied Physics Letters X-ray SpectroscopyEngineeringLaser-plasma InteractionLaser Beam Nonuniformity500-Ev X-ray Pulses	1980	12
Quantitative intensity measurements using a soft X-ray streak camera R. L. Kauffman, G. L. Stradling, David Attwood, IEEE Journal of Quantum Electronics X-ray SpectroscopyEngineeringQuantitative Intensity MeasurementsPolycapillary OpticsTypical Calibration	1983	12

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