Li-Ming Denq

A Memory Built-In Self-Repair Scheme Based on Configurable Spares

Mincent Lee, Li-Ming Denq, Cheng‐Wen Wu · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2011 · 40 citations

Engineering, Mem Testing, Computer Architecture +19

SOC Test Architecture and Method for 3-D ICs

Chih-Yen Lo, Yu-Tsao Hsing, Li-Ming Denq et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2010 · 31 citations

Engineering, Vlsi Design, Computer Architecture +17

A Hybrid BIST Scheme for Multiple Heterogeneous Embedded Memories

Li-Ming Denq, Cheng‐Wen Wu · 2007 · 18 citations

Non-volatile Memory, Engineering, Mem Testing +16

An Enhanced SRAM BISR Design with Reduced Timing Penalty

Li-Ming Denq, Tzuchiang Wang, Cheng‐Wen Wu · Asian Test Symposium · 2006 · 11 citations

Hardware Security, Electrical Engineering, Memory Architecture +15

3D-IC BISR for stacked memories using cross-die spares

Chun‐Chuan Chi, Yung-Fa Chou, Ding-Ming Kwai et al. · 2012 · 11 citations

Hardware Security, Yield Gain, Electrical Engineering +13