J. Foerstner - Concepedia

Author

J. Foerstner

Motorola (United States)

Also Known As

J. Foerstner, Juergen Foerstner

Publications

308

Citations

H-Index

Concepts

All Affiliations

Motorola (United States)Korea Advanced Institute of Science and Technology Arizona State University

About

J. Foerstner is an author at Motorola (United States) specializing in electrical engineering, microelectronics, and engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	12	12	272
2	Electrical Engineering	12	12	272
3	Applied Physics	8	8	173
4	Computer Engineering	5	5	111
5	Materials Engineering	1	1	56

J. Foerstner

Publications

272

Citations

H-Index

Page 1

	Year	Citations
Analysis of floating body induced transient behaviors in partially depleted thin film SOI devices H.C. Shin, Ik-Sung Lim, M. Racanelli, IEEE Transactions on Electron Devices Device ModelingMaterials EngineeringElectrical EngineeringTransient EffectEngineering	1996	56
MOSAIC V-a very high performance bipolar technology V. dela Torre, J. Foerstner, B. Lojek, EngineeringVlsi DesignComputer ArchitectureIntegrated CircuitsMosaic V	2002	36
Comparison of Soi Versus Bulk Silicon Substrate Crosstalk Properties for Mixed-Mode IC's M. K. A. Rahim, Bor-Yuan Hwang, J. Foerstner 3D Ic ArchitectureElectrical EngineeringEngineeringAdvanced Packaging (Semiconductors)Microfabrication	2005	29
TFSOI complementary BiCMOS technology for low power applications K. Klein, M.G. Grimaldi, M. Racanelli, IEEE Transactions on Electron Devices Low Power ApplicationsEngineeringVlsi DesignIntegrated CircuitsSilicon On Insulator	1995	28
Measurement of carrier generation lifetime in SOI devices Hyungcheol Shin, M. Racanelli, W.M. Huang, Solid-State Electronics Electrical EngineeringEngineeringHardware ReliabilityBias Temperature InstabilityApplied Physics	1999	24
Motorola MEMS switch technology for high frequency applications A.P. De Silva, C. Vaughan, D. R. Frear, Low-power ElectronicsElectrical EngineeringMems Switch TechnologyEngineeringRf Semiconductor	2002	22
A simple technique to measure generation lifetime in partially depleted SOI MOSFETs Hyungcheol Shin, M. Racanelli, W.M. Huang, IEEE Transactions on Electron Devices Effective Generation LifetimeElectrical EngineeringEngineeringHardware ReliabilityInch Wafers	1998	14
Behavior of contact-silicided TFSOI gate-structures J. Foerstner, Joyelle Jones, Margaret Huang, Circuit SpeedEngineeringModern MosfetIntegrated CircuitsSilicon On Insulator	2002	13
Lifetime reliability of thin-film SOI nMOSFET's J. Wang-Ratkovic, W.M. Huang, B.-Y. Hwang, IEEE Electron Device Letters Lifetime ReliabilityElectrical EngineeringReliability StudyEngineeringNanoelectronics	1995	13
TFSOI CMOS technology for sub-1 V microcontroller circuits W.M. Huang, K. Papworth, M. Racanelli, Low-power ElectronicsSystem On ChipElectrical EngineeringHardware SecurityEngineering	2002	13

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