Concepedia

Publication | Closed Access

Measurement of carrier generation lifetime in SOI devices

DOI

24

Citations

8

References

1999

Year

Hyungcheol Shin, M. Racanelli, W.M. Huang, J. Foerstner, Taekeun Hwang, D.K. Schroder
Solid-State Electronics

References

YearCitations

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