Hidetake Tanaka

Bit Cost Scalable Technology with Punch and Plug Process for Ultra High Density Flash Memory

Hidetake Tanaka, M. Kido, K. Yahashi et al. · 2007 · 576 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +15

Legionella inactivation with diamond electrodes

Tsuneto Furuta, Hidetake Tanaka, Yoshinori Nishiki et al. · Diamond and Related Materials · 2004 · 57 citations

Microbiology, Legionella Inactivation, Infection Control +4

Cross sections for electron impact excitation of the C Π1 and D Σ1+ electronic states in N2O

H. Kawahara, Daisuke Suzuki, H. Kato et al. · The Journal of Chemical Physics · 2009 · 32 citations

Localized Excited State, Engineering, Computational Chemistry +18

A 60-ns 4-Mbit CMOS DRAM with built-in selftest function

Takashi Ohsawa, T. Furuyama, Yoshihiro Watanabe et al. · IEEE Journal of Solid-State Circuits · 1987 · 26 citations

Hardware Security, Electrical Engineering, Engineering +11

An experimental 2-bit/cell storage DRAM for macrocell or memory-on-logic application

T. Furuyama, Takashi Ohsawa, Y. Nagahama et al. · IEEE Journal of Solid-State Circuits · 1989 · 25 citations

Cell Array, Non-volatile Memory, Engineering +19