Reydezel Torres‐Torres

Impact of technology scaling on the input and output features of RF-MOSFETs: effects and modeling

Reydezel Torres‐Torres, Roberto S. Murphy‐Arteaga, E. Augendre et al. · 2004 · 100 citations

Device Modeling, Electrical Engineering, Engineering +11

Analytical Model and Parameter Extraction to Account for the Pad Parasitics in RF-CMOS

Reydezel Torres‐Torres, Roberto S. Murphy‐Arteaga, J. A. Reynoso‐Hernández · IEEE Transactions on Electron Devices · 2005 · 73 citations

Engineering, Radio Frequency, Pad Parasitics +18

MOSFET bias dependent series resistance extraction from RF measurements

Reydezel Torres‐Torres, Roberto S. Murphy‐Arteaga, Stefaan Decoutere · Electronics Letters · 2003 · 51 citations

Device Modeling, Bias Dependence, Electrical Engineering +13

Extracting characteristic impedance in low-loss substrates

Reydezel Torres‐Torres · Electronics Letters · 2011 · 41 citations

Transmission Lines, Electrical Engineering, Engineering +11

A method to determine the gate bias-dependent and gate bias-independent components of MOSFET series resistance from S-parameters

Emmanuel Torres Rios, Reydezel Torres‐Torres, G. Valdovinos-Fierro et al. · IEEE Transactions on Electron Devices · 2006 · 33 citations

Device Modeling, Electrical Engineering, Engineering +7