Joseph M. Basile

Soft Error Susceptibilities of 22 nm Tri-Gate Devices

N. Seifert, B. Gill, Shah M. Jahinuzzaman et al. · IEEE Transactions on Nuclear Science · 2012 · 184 citations

Engineering, Computer Engineering, Electrical Engineering +17

Soft Error Rate Improvements in 14-nm Technology Featuring Second-Generation 3D Tri-Gate Transistors

N. Seifert, Shah M. Jahinuzzaman, Jyothi Velamala et al. · IEEE Transactions on Nuclear Science · 2015 · 126 citations

Engineering, Computer Engineering, Electrical Engineering +17

Leakage power modeling and reduction with data retention

Weiping Liao, Joseph M. Basile, Lei He · Digest of technical papers/Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design · 2002 · 59 citations

Engineering, Computer Engineering, Computer Science +17

Microarchitecture-level leakage reduction with data retention

Weiping Liao, Joseph M. Basile, Lei He · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2005 · 11 citations

Engineering, Computer Engineering, Computer Science +17