J. C. Woicik

Statistics

Publications

Citations

102

H-Index

Active since

1986

Affiliations

National Institute of Standards and Technology(Current)

Stanford Medicine

Brookhaven National Laboratory

J. C. Woicik is an author at National Institute of Standards and Technology specializing in materials science, semiconductor materials, and electronic materials.

Publications per year

1986–2012

Publications

Hard x-ray photoelectron spectroscopy study of As and Ga out-diffusion in In0.53Ga0.47As/Al2O3 film systems

Conan Weiland, P. Lysaght, J. Price et al. · Applied Physics Letters · 2012 · 25 citations

Natural Sciences, Materials Engineering, Materials Science +13

Band alignment of atomic layer deposited HfO2 on clean and N passivated germanium surfaces

Abdul K. Rumaiz, J. C. Woicik, G. Carini et al. · Applied Physics Letters · 2010 · 16 citations

Natural Sciences, Materials Engineering, Materials Science +17

Surface extended x‐ray adsorption fine structure studies of the Si(001) 2×1–Sb interface

M. C. Richter, J. C. Woicik, P. Pianetta et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1991 · 16 citations

Natural Sciences, Materials Science, Physics +17

Temperature-dependent local structure of LaFeAsO1−xFx: Probing the atomic correlations

Trevor A. Tyson, Tao Wu, J. C. Woicik et al. · Journal of Applied Physics · 2010 · 12 citations · Full text

Natural Sciences, Materials Science, Physics +17

Determination of the geometrical configuration of Bi on GaAs (110) by x-ray standing wave triangulation

Alberto Herrera‐Gómez, T. Kendelewicz, J. C. Woicik et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1993 · 11 citations

Natural Sciences, Materials Engineering, Materials Science +16

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