M. C. Richter

$\mbox{\sffamily\bfseries NiFe}_{\hbox{\sffamily\bfseries\fontsize{12}{12}\selectfont 2}}\mbox{\sffamily\bfseries O}_{\hbox{\sffamily\bfseries\fontsize{12}{12}\selectfont 4}}$ and $\mbox{\sffamily\bfseries Fe}_{\hbox{\sffamily\bfseries\fontsize{12}{12}\selectfont 3}}\mbox{\sffamily\bfseries O}_{\hbox{\sffamily\bfseries\fontsize{12}{12}\selectfont 4}}$ studied by XMCD and resonant photoemission

M. C. Richter, J.-M. Mariot, O. Heckmann et al. · The European Physical Journal Special Topics · 2009 · 16 citations

Natural Sciences, Materials Science, Spectroscopy +1

Surface extended x‐ray adsorption fine structure studies of the Si(001) 2×1–Sb interface

M. C. Richter, J. C. Woicik, P. Pianetta et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1991 · 16 citations

Natural Sciences, Materials Science, Physics +17

Localization of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mn>3</mml:mn><mml:mi>d</mml:mi></mml:math>electrons in thin Mn and Mn-oxide films by resonant photoemission

M. C. Richter, Peter Bencok, R. Brochier et al. · Physical review. B, Condensed matter · 2001 · 13 citations

Natural Sciences, Materials Science, Physics +15