H. Katto - Concepedia

Author

H. Katto

Hitachi (Japan)

Also Known As

H. KATTO, H. Katto, Hisao Katto

Publications

403

Citations

H-Index

Concepts

All Affiliations

Hitachi (Japan)Musashi University

About

H. Katto is an author at Hitachi (Japan) specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	12	14	327
2	Electrical Engineering	12	14	327
3	Applied Physics	7	7	137
4	Computer Engineering	5	5	139
5	Education	1	1	19

H. Katto

Publications

327

Citations

H-Index

Page 1

	Year	Citations
A 5 V-only 64K dynamic RAM based on high S/N design H. Masuda, R. Hori, Y. Kamigaki, IEEE Journal of Solid-State Circuits Non-volatile MemoryElectrical EngineeringEngineeringVlsi DesignVlsi Architecture	1980	54
A single 5V 64K dynamic RAM K. Itoh, R. Hori, H. Masuda, Hardware SecurityLow-power ElectronicsElectrical EngineeringMemory ArchitectureEngineering	1980	35
Hot carrier degradation modes and optimization of LDD MOSFETs H. Katto, Kikuo Okuyama, S. Meguro, Semiconductor TechnologyElectrical EngineeringEngineeringStress-induced Leakage CurrentOxide Degradation	1984	34
Device parameter extraction in the linear region of MOSFET's H. Katto IEEE Electron Device Letters Device ModelingElectrical EngineeringEngineeringSelf-consistent TechniqueElectronic Engineering	1997	31
Preparation and Properties of Aluminum Oxide Films Obtained by Glow Discharge Technique H. Katto, Yasutoshi Koga Journal of The Electrochemical Society Aluminum Oxide FilmsAluminium NitrideEngineeringGlow DischargeThin Film Process Technology	1971	27
Hi-MNOS II technology for a 64-kbit byte-erasable 5-V-only EEPROM Y. Yatsuda, Shinji Nabetani, Ken Uchida, IEEE Transactions on Electron Devices Non-volatile MemoryEngineeringVlsi DesignEmerging Memory TechnologyComputer Architecture	1985	21
Low-frequency 1/<i>f</i> noise in MOSFET’s at low current levels Masaaki Aoki, H. Katto, E. Yamada Journal of Applied Physics Activated ConductionSemiconductor TechnologyElectrical EngineeringEngineeringElectronic Engineering	1977	21
Wafer-level Jramp and J-constant electromigration testing of conventional and SWEAT patterns assisted by a thermal and electrical simulator H. Katto, Masahide Harada, Yuki Higuchi Electrical EngineeringElectrical SimulatorEngineeringHigh Temperature MaterialsElectromigration Technique	2002	19
VLSI reliability challenges: from device physics to wafer scale systems Eiji Takeda, K. Ikuzaki, H. Katto, Proceedings of the IEEE EngineeringMeasurementComputer ArchitectureWafer Scale TestingEducation	1993	19
Surface state density evaluation using high-frequency MOS capacitance technique H. Katto, Yokichi Itoh physica status solidi (a) Device ModelingSemiconductorsElectrical EngineeringSurface CharacterizationEngineering	1974	16

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