Lei Shu - Concepedia

Author

Lei Shu

Beijing Microelectronics Technology Institute ORCID

Also Known As

L. Shu, Lei SHu, Lei Shu, Lei 蕾 Shu 殳, Liyang Shu, Liyong Shu, Shu Lei, Shu, L.

Publications

447

Citations

H-Index

Concepts

All Affiliations

Beijing Microelectronics Technology Institute Harbin Institute of Technology University of Electronic Science and Technology of China Vanderbilt University Beijing University of Posts and Telecommunications

About

Lei Shu is an author at Beijing Microelectronics Technology Institute specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	10	10	244
2	Applied Physics	7	7	175
3	Medicine	1	1	18
4	Natural Sciences	1	1	11
5	Chemistry	1	1	27

Lei Shu

Publications

290

Citations

H-Index

Page 1

	Year	Citations
Simulation Research on Single Event Burnout Performances of p-GaN Gate HEMTs With 2DEG Al<sub> <i>x</i> </sub>Ga<sub>1-<i>x</i> </sub>N Channel Shuang Liu, Jincheng Zhang, Shenglei Zhao, IEEE Transactions on Electron Devices Wide-bandgap SemiconductorElectrical EngineeringEngineeringNanoelectronicsElectronic Engineering	2022	40
Radiation hardness evaluation of ε-Ga2O3 thin-film devices under swift heavy ion irradiation Yongtao Yang, Yuanjun Tang, Fanyu Liu, Applied Surface Science Materials ScienceIon ImplantationRadiation Hardness EvaluationEngineeringApplied Physics	2023	35
Total-Ionizing-Dose Irradiation-Induced Dielectric Field Enhancement for High-Voltage SOI LDMOS Xin Zhou, Zhangyi’an Yuan, Lei Shu, IEEE Electron Device Letters Electrical EngineeringIon ImplantationEngineeringHigh-voltage Soi LdmosTid Radiation	2019	32
Benzene-thermal synthesis and characterization of ultrafine powders of antimony sulfide Shu‐Hong Yu, Lei Shu, Yongsheng Wu, Materials Research Bulletin Materials EngineeringMaterials ScienceExperimental SynthesisEngineeringChemistry	1998	27
Numerical and Experimental Investigation of TID Radiation Effects on the Breakdown Voltage of 400-V SOI NLDMOSFETs Lei Shu, Liang Wang, Xin Zhou, IEEE Transactions on Nuclear Science Device ModelingElectrical EngineeringTotal Ionizing DoseEngineeringSemiconductor Device	2019	25
Investigation on total-ionizing-dose radiation response for high voltage ultra-thin layer SOI LDMOS Xin Zhou, Lingfang Zhang, Ming Qiao, Electrical EngineeringIon ImplantationEngineeringSemiconductor DeviceNanoelectronics	2018	20
Effect of Drift Length on Shifts in 400-V SOI LDMOS Breakdown Voltage Due to TID Lei Shu, Yuanfu Zhao, K.F. Galloway, IEEE Transactions on Nuclear Science	2020	20
Modeling Irradiation-Induced Degradation for 4H-SiC Power MOSFETs Shiwei Liang, Yu Yang, Lei Shu, IEEE Transactions on Electron Devices Device ModelingGamma-ray IrradiationElectrical EngineeringSemiconductor DeviceEngineering	2023	19
TID-Induced OFF-State Leakage Current in Partially Radiation-Hardened SOI LDMOS Lei Shu, Liang Wang, Kai Zhao, IEEE Transactions on Nuclear Science Total Ionizing DoseEngineeringRadiation EffectRadiation ExposureField Oxide	2020	18
Compatibility between high-flux helium plasma irradiated molybdenum and liquid lithium Pingni He, Zhiyan Zhang, Wenxin Xia, Journal of Nuclear Materials Materials ScienceEngineeringPhysicsHigh-flux Helium PlasmaControlled Nuclear Fusion	2018	17

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