Concepedia

Şafak Sayan

ŞS

Statistics

Publications

35

Citations

2K

H-Index

22

Active since

1997

Affiliations

Rutgers, The State University of New Jersey(Current)

IMEC

Intel (United States)

National Institute of Standards and Technology

Bilkent University

Şafak Sayan is an author at Rutgers, The State University of New Jersey specializing in engineering, applied physics, and materials science.

Top concepts

EngineeringApplied PhysicsMaterial ScienceChemistrySurface ScienceMicroelectronicsThin FilmsElectrical EngineeringMaterials EngineeringSemiconductors

Publications per year

1997–2020

35

Publications

35

Effect of nitrogen on band alignment in HfSiON gate dielectrics

Şafak Sayan, Nhan V. Nguyen, James R. Ehrstein et al. · Applied Physics Letters · 2005 · 456 citations

Oxide Heterostructures, Materials Science, Electrical Engineering +15

Soft x-ray photoemission studies of the HfO2/SiO2/Si system

Şafak Sayan, Eric Garfunkel, Şefik Süzer · Applied Physics Letters · 2002 · 164 citations

Materials Science, Semiconductors, Semiconductor Technology +11

Soft x-ray photoemission studies of Hf oxidation

Şefik Süzer, Şafak Sayan, Mark M. Banaszak Holl et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2002 · 111 citations · Full text

X-ray Spectroscopy, Engineering, Binding Energy Shifts +16

Band alignment issues related to HfO2∕SiO2∕p-SiHfO2∕SiO2∕p-Si gate stacks

Şafak Sayan, T. Emge, Eric Garfunkel et al. · Deep Blue (University of Michigan) · 2010 · 106 citations · Full text

Structural, electronic, and dielectric properties of ultrathin zirconia films on silicon

Şafak Sayan, Nhan V. Nguyen, James R. Ehrstein et al. · Applied Physics Letters · 2005 · 103 citations

Materials Science, Materials Engineering, Electrical Engineering +15

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