Şafak Sayan

ŞS

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Publications

Citations

2.1K

H-Index

Active since

1997

Affiliations

Rutgers, The State University of New Jersey(Current)

IMEC

Intel (United States)

National Institute of Standards and Technology

Bilkent University

Şafak Sayan is an author at Rutgers, The State University of New Jersey specializing in materials science, materials engineering, and natural sciences.

ORCID

Publications per year

1997–2020

Publications

Effect of nitrogen on band alignment in HfSiON gate dielectrics

Şafak Sayan, Nhan V. Nguyen, James R. Ehrstein et al. · Applied Physics Letters · 2005 · 456 citations

Natural Sciences, Materials Science, Physics +17

Soft x-ray photoemission studies of the HfO2/SiO2/Si system

Şafak Sayan, Eric Garfunkel, Şefik Süzer · Applied Physics Letters · 2002 · 165 citations

Natural Sciences, Materials Engineering, Materials Science +17

Soft x-ray photoemission studies of Hf oxidation

Şefik Süzer, Şafak Sayan, Mark M. Banaszak Holl et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2002 · 113 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +15

Structural, electronic, and dielectric properties of ultrathin zirconia films on silicon

Şafak Sayan, Nhan V. Nguyen, James R. Ehrstein et al. · Applied Physics Letters · 2005 · 107 citations

Natural Sciences, Materials Engineering, Materials Science +17

Band alignment issues related to HfO2∕SiO2∕p-SiHfO2∕SiO2∕p-Si gate stacks

Şafak Sayan, T. Emge, Eric Garfunkel et al. · Deep Blue (University of Michigan) · 2004 · 106 citations · Full text

Natural Sciences, Materials Science, Physics +17

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