Philippe Niedermann - Concepedia

Author

Philippe Niedermann

Swiss Center for Electronics and Microtechnology (Switzerland)ORCID

Also Known As

P Niedermann, P. Niedermann, Philippe Niedermann

Publications

1.6K

Citations

H-Index

Concepts

All Affiliations

Swiss Center for Electronics and Microtechnology (Switzerland)ETH Zurich Politecnico di Milano University of Milano-Bicocca École Polytechnique Fédérale de Lausanne

About

Philippe Niedermann is an author at Swiss Center for Electronics and Microtechnology (Switzerland) specializing in engineering, applied physics, and microfabrication.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	17	22	1.3K
2	Applied Physics	11	13	513
3	Biomedical Engineering	5	5	690
4	Medicine	3	3	509
5	Health Sciences	1	1	62

Philippe Niedermann

Publications

1.5K

Citations

H-Index

Page 1

	Year	Citations
FluidFM: Combining Atomic Force Microscopy and Nanofluidics in a Universal Liquid Delivery System for Single Cell Applications and Beyond André Meister, Michael Gabi, Pascal Behr, Nano Letters EngineeringAfm TipMicroscopyAnalytical MicrosystemsBiofabrication	2009	452
Scaling Hetero-Epitaxy from Layers to Three-Dimensional Crystals C.V. Falub, H. von Känel, Fabio Isa, Science EngineeringSige CrystalsSilicon On InsulatorSemiconductor NanostructuresSemiconductors	2012	160
Three-Dimensional Microfluidic Confinement for Efficient Sample Delivery to Biosensor Surfaces. Application to Immunoassays on Planar Optical Waveguides Oliver T. Hofmann, Guy Voirin, Philippe Niedermann, Analytical Chemistry EngineeringAnalytical MicrosystemsFlow CellBiofabricationOrgan-on-a-chip	2002	141
X-ray interferometer with bent gratings: Towards larger fields of view Vincent Revol, Christian Kottler, R. Kaufmann, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment EngineeringHealth SciencesMicroscopyCalibrationX-ray Diffraction	2010	62
Evaluating probes for “electrical” atomic force microscopy Thomas Trenkler, Thomas Hantschel, R. J. Stephenson, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringConductive Afm TechniquesMicroscopyNanotribologyMicroscopy Method	2000	61
Unexpected Dominance of Vertical Dislocations in High‐Misfit Ge/Si(001) Films and Their Elimination by Deep Substrate Patterning Anna Marzegalli, Fabio Isa, E. Müller, Advanced Materials EngineeringUnexpected DominanceDeep Substrate PatterningSilicon On InsulatorInnovative Strategy	2013	58
Parallel AFM imaging and force spectroscopy using two‐dimensional probe arrays for applications in cell biology M. Favre, Jérôme Polesel‐Maris, Thomas Overstolz, Journal of Molecular Recognition	2011	57
Modular approach to fabrication of three-dimensional microchannel systems in PDMS—application to sheath flow microchips Oliver T. Hofmann, Philippe Niedermann, A. Manz Lab on a Chip Building BlocksEngineeringMicrochannel SystemAnalytical MicrosystemsModular Approach	2001	51
Self-aligned Ge and SiGe three-dimensional epitaxy on dense Si pillar arrays Roberto Bergamaschini, Fabio Isa, C.V. Falub, Surface Science Reports EngineeringPhysicsSelf-aligned GeApplied PhysicsSemiconductor Device Fabrication	2013	46
Highly Mismatched, Dislocation‐Free SiGe/Si Heterostructures Fabio Isa, Marco Salvalaglio, Yadira Arroyo Rojas Dasilva, Advanced Materials Materials EngineeringMaterials ScienceDislocation‐free Sige/si HeterostructuresEngineeringInnovative Strategy	2015	42

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