52
Publications
2.1K
Citations
24
H-Index
1979
Active since
R. Kaufmann is an author at Swiss Center for Electronics and Microtechnology (Switzerland) specializing in engineering, materials science, and applied physics.
Top concepts
EngineeringMaterial ScienceApplied PhysicsInstrumentationRadiologyMicroscopyHealthPhysicsX-ray ImagingBiomedical Imaging
Publications per year
1979–2020
52
52
Thierry Oggier, Michael Lehmann, R. Kaufmann et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 236 citations
Noise analysis of grating-based x-ray differential phase contrast imaging
Vincent Revol, Christian Kottler, R. Kaufmann et al. · Review of Scientific Instruments · 2010 · 143 citations
Sub-pixel porosity revealed by x-ray scatter dark field imaging
Vincent Revol, Iwan Jerjen, Christian Kottler et al. · Journal of Applied Physics · 2011 · 102 citations
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