W. R. Thurber - Concepedia

Author

W. R. Thurber

National Institute of Standards and Technology

Also Known As

W R Thurber, W Robert Thurber, W. R. THURBER, W. R. Thurber, W. ROBERT THURBER, W. Robert Thurber, W.R. Thurber, W.Robert Thurber

Publications

2.3K

Citations

H-Index

Concepts

All Affiliations

National Institute of Standards and Technology

About

W. R. Thurber is an author at National Institute of Standards and Technology specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	15	1.7K
2	Applied Physics	12	13	1.5K
3	Electrical Engineering	11	12	1.2K
4	Natural Sciences	5	5	157
5	Materials Engineering	1	1	98

W. R. Thurber

Publications

1.8K

Citations

H-Index

Page 1

	Year	Citations
Electronic Transport in Strontium Titanate H. P. R. Frederikse, W. R. Thurber, W. R. Hosler Physical Review Materials ScienceEngineeringPhysicsApplied PhysicsCondensed Matter Physics	1964	521
The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon Sheng S. Li, W. R. Thurber Solid-State Electronics Electrical EngineeringEngineeringDopant DensityTemperature DependenceApplied Physics	1977	264
Resistivity‐Dopant Density Relationship for Phosphorus‐Doped Silicon W. R. Thurber, R. L. Mattis, Y. M. Liu, Journal of The Electrochemical Society Materials ScienceSemiconductorsElectrical EngineeringElectronic DevicesResistivity‐dopant Density Relationship	1980	246
Resistivity‐Dopant Density Relationship for Boron‐Doped Silicon W. R. Thurber, R. L. Mattis, Y. M. Liu, Journal of The Electrochemical Society SemiconductorsResistivity‐dopant Density RelationshipElectrical EngineeringElectronic DevicesEngineering	1980	210
Bridge and van der Pauw Sheet Resistors for Characterizing the Line Width of Conducting Layers M. Buehler, S. D. T. Grant, W. R. Thurber Journal of The Electrochemical Society Electrical EngineeringBoron NitrideEngineeringSpecific ResistanceResistor	1978	158
An Experimental Study of Various Cross Sheet Resistor Test Structures M. Buehler, W. R. Thurber Journal of The Electrochemical Society Materials EngineeringMaterials ScienceElectrical EngineeringSheet ResistanceEngineering	1978	98
Second indirect band gap in silicon Richard A. Forman, W. R. Thurber, D. E. Aspnes Solid State Communications Semiconductor MaterialApplied PhysicsPhysicsSilicon On Insulator	1974	45
A planar four-probe test structure for measuring bulk resistivity M. Buehler, W. R. Thurber IEEE Transactions on Electron Devices EngineeringIntegrated CircuitsSemiconductor DeviceSemiconductorsElectronic Devices	1976	41
A novel method to detect nonexponential transients in deep level transient spectroscopy W. R. Thurber, Richard A. Forman, W. E. Phillips Journal of Applied Physics Transient GratingEngineeringMeasurementNovel Experimental MethodSpectrochemical Analysis	1982	39
Theory and application of a two-layer Hall technique Robert D. Larrabee, W. R. Thurber IEEE Transactions on Electron Devices EngineeringComputer-aided DesignTopological Quantum StateSilicon On InsulatorSemiconductor Device	1980	36

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