W. Kaindl

Charge carrier avalanche multiplication in high-voltage diodes triggered by ionizing radiation

Gerald Soelkner, Paul L. Voss, W. Kaindl et al. · IEEE Transactions on Nuclear Science · 2000 · 49 citations

Electrical Engineering, Ion Implantation, Engineering +11

Dynamics of incomplete ionized dopants and their impact on 4H/6H-SiC devices

M. Lades, W. Kaindl, Nando Kaminski et al. · IEEE Transactions on Electron Devices · 1999 · 47 citations

Electrical Engineering, 4H/6h-sic Devices, Engineering +14

Reliability of SiC Power Devices Against Cosmic Radiation-Induced Failure

Gerald Soelkner, W. Kaindl, Michael Treu et al. · Materials science forum · 2007 · 33 citations

Reliability, Electrical Engineering, Reliability Engineering +12

Experimental characterization and numerical simulation of the electrical properties of nitrogen, aluminum, and boron in 4H/6H-SiC

W. Kaindl, M. Lades, Nando Kaminski et al. · Journal of Electronic Materials · 1999 · 31 citations

Materials Science, Electrical Engineering, Boron Nitride +8

Analysis of the role of the parasitic BJT of Super-Junction power MOSFET under TLP stress

Tudor Chirila, W. Kaindl, T. Reimann et al. · Microelectronics Reliability · 2015 · 11 citations

Electrical Engineering, Tlp Stress, Engineering +9