Publication | Closed Access
Analysis of the role of the parasitic BJT of Super-Junction power MOSFET under TLP stress
11
Citations
8
References
2015
Year
Electrical EngineeringTlp StressEngineeringPower DeviceStress-induced Leakage CurrentBias Temperature InstabilityPower Semiconductor DeviceSuper-junction Power MosfetPower ElectronicsMicroelectronicsParasitic BjtSemiconductor Device
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