X.P. Wang

Fermi Pinning-Induced Thermal Instability of Metal-Gate Work Functions

H.Y. Yu, C. Ren, Yee‐Chia Yeo et al. · IEEE Electron Device Letters · 2004 · 131 citations

Engineering, Electrical Engineering, Materials Science +17

Tuning effective metal gate work function by a novel gate dielectric HfLaO for nMOSFETs

X.P. Wang, Mingfu Li, C. Ren et al. · IEEE Electron Device Letters · 2005 · 68 citations

Engineering, Electrical Engineering, Materials Science +17

A fast measurement technique of MOSFETI/sub d/-V/sub g/ characteristics

Chen Shen, M.-F. Li, X.P. Wang et al. · IEEE Electron Device Letters · 2005 · 66 citations

Engineering, Electrical Engineering, Analog Electronics +14

Negative U traps in HfO/sub 2/ gate dielectrics and frequency dependence of dynamic BTI in MOSFETs

Chen Shen, M.F. Li, X.P. Wang et al. · 2005 · 59 citations

Engineering, Electrical Engineering, Physics +16

Wide $V_{\rm fb}$ and $V_{\rm th}$ Tunability for Metal-Gated MOS Devices With HfLaO Gate Dielectrics

X.P. Wang, H.Y. Yu, M.-F. Li et al. · IEEE Electron Device Letters · 2007 · 57 citations

Engineering, Electrical Engineering, Materials Science +17