J. Herman

Extremely thin SOI (ETSOI) CMOS with record low variability for low power system-on-chip applications

Kangguo Cheng, A. Khakifirooz, P. Kulkarni et al. · 2009 · 104 citations

Engineering, Computer Engineering, Electrical Engineering +17

RTA-Driven Intra-Die Variations in Stage Delay, and Parametric Sensitivities for 65nm Technology

Ishtiaq Ahsan, N. Zamdmer, O. Glushchenkov et al. · 2006 · 66 citations

Engineering, Computer Engineering, Electrical Engineering +17

Fully depleted extremely thin SOI technology fabricated by a novel integration scheme featuring implant-free, zero-silicon-loss, and faceted raised source/drain

Kangguo Cheng, A. Khakifirooz, P. Kulkarni et al. · Symposium on VLSI Technology · 2006 · 31 citations

Engineering, Electrical Engineering, Materials Science +17

Challenges and opportunities of extremely thin SOI (ETSOI) CMOS technology for future low power and general purpose system-on-chip applications

A. Khakifirooz, Kangguo Cheng, P. Kulkarni et al. · 2010 · 28 citations

Engineering, Computer Engineering, Electrical Engineering +17

A high-performance sub-0.25 μm CMOS technology with multiple thresholds and copper interconnects

L.T. Su, R. Schulz, J. Adkisson et al. · 2002 · 26 citations

Engineering, Computer Engineering, Electrical Engineering +17