Mariia Gorchichko

Total-Ionizing-Dose Effects and Low-Frequency Noise in 30-nm Gate-Length Bulk and SOI FinFETs With SiO₂/HfO₂Gate Dielectrics

Mariia Gorchichko, Yanrong Cao, En Xia Zhang et al. · IEEE Transactions on Nuclear Science · 2019 · 43 citations

Engineering, Electrical Engineering, Electronic Materials +16

Total-Ionizing-Dose Effects and Low-Frequency Noise in 16-nm InGaAs FinFETs With HfO₂/Al₂O₃ Dielectrics

Stefano Bonaldo, V. Putcha, Dimitri Linten et al. · IEEE Transactions on Nuclear Science · 2019 · 33 citations

Engineering, Electrical Engineering, Materials Science +15

Total Ionizing Dose Responses of 22-nm FDSOI and 14-nm Bulk FinFET Charge-Trap Transistors

Rachel M. Brewer, En Xia Zhang, Mariia Gorchichko et al. · IEEE Transactions on Nuclear Science · 2021 · 25 citations

Engineering, Computer Engineering, Electrical Engineering +17

Total-Ionizing-Dose Response of Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors

Mariia Gorchichko, En Xia Zhang, Pan Wang et al. · IEEE Transactions on Nuclear Science · 2021 · 25 citations

Engineering, Computer Engineering, Electrical Engineering +17

TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses

Stefano Bonaldo, Mariia Gorchichko, En Xia Zhang et al. · IEEE Transactions on Nuclear Science · 2022 · 24 citations

Engineering, Electrical Engineering, Materials Science +17