Stefano Bonaldo

Influence of LDD Spacers and H⁺Transport on the Total-Ionizing-Dose Response of 65-nm MOSFETs Irradiated to Ultrahigh Doses

F. Faccio, G. Borghello, Edoardo Lerario et al. · IEEE Transactions on Nuclear Science · 2017 · 103 citations

Engineering, Materials Science, Radiation Physics +16

Ionizing-Radiation Response and Low-Frequency Noise of 28-nm MOSFETs at Ultrahigh Doses

Stefano Bonaldo, S. Mattiazzo, Christian Enz et al. · IEEE Transactions on Nuclear Science · 2020 · 59 citations · Full text

Medicine, Electrical Engineering, Radiation Dosimetry +16

A plug, print & play inkjet printing and impedance-based biosensing technology operating through a smartphone for clinical diagnostics

Giulio Rosati, Massimo Urban, Lei Zhao et al. · Biosensors and Bioelectronics · 2021 · 55 citations · Full text

Engineering, Bioengineering, Biomedical Engineering +17

Influence of Halo Implantations on the Total Ionizing Dose Response of 28-nm pMOSFETs Irradiated to Ultrahigh Doses

Stefano Bonaldo, S. Mattiazzo, Christian Enz et al. · IEEE Transactions on Nuclear Science · 2018 · 50 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

TID Degradation Mechanisms in 16-nm Bulk FinFETs Irradiated to Ultrahigh Doses

Teng Ma, Stefano Bonaldo, S. Mattiazzo et al. · IEEE Transactions on Nuclear Science · 2021 · 48 citations · Full text

Engineering, Materials Engineering, Materials Science +16