Joon Goo Hong

Electron trapping in noncrystalline remote plasma deposited Hf-aluminate alloys for gate dielectric applications

R. S. Johnson, Joon Goo Hong, Christopher L. Hinkle et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2002 · 46 citations

Engineering, Solid-state Chemistry, Gate Dielectric Applications +17

Electron traps at interfaces between Si(100) and noncrystalline Al2O3, Ta2O5, and (Ta2O5)x(Al2O3)1−x alloys

R. S. Johnson, Joon Goo Hong, G. Lucovsky · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2001 · 41 citations · Full text

Materials Science, Materials Engineering, Electrical Engineering +14

Spectroscopic studies of metal high‐<i>k</i> dielectrics: transition metal oxides and silicates, and complex rare earth/transition metal oxides

G. Lucovsky, Joon Goo Hong, C. C. Fulton et al. · physica status solidi (b) · 2004 · 31 citations

Oxide Heterostructures, Materials Science, Rare Earth Mineral +13

Soft x-ray photoelectron spectroscopy of (HfO2)x(SiO2)1−x high-k gate-dielectric structures

Marc Ulrich, Joon Goo Hong, J. E. Rowe et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2003 · 30 citations · Full text

Semiconductors, Materials Science, X-ray Spectroscopy +14

X-ray absorption spectra for transition metal high-κ dielectrics: Final state differences for intra- and inter-atomic transitions

G. Lucovsky, Joon Goo Hong, C. C. Fulton et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2004 · 25 citations

X-ray Absorption Spectra, X-ray Spectroscopy, Engineering +20