C. C. Fulton

Structural, microstructural, and electrical properties of gold films and Schottky contacts on remote plasma-cleaned, n-type ZnO{0001} surfaces

B. J. Coppa, C. C. Fulton, Sharon Kiesel et al. · Journal of Applied Physics · 2005 · 136 citations

Natural Sciences, Materials Science, Physics +17

Measurement of the band offsets of SiO2 on clean <i>n</i>- and <i>p</i>-type GaN(0001)

T. E. Cook, C. C. Fulton, Will Mecouch et al. · Journal of Applied Physics · 2003 · 100 citations

Engineering, Materials Engineering, Materials Science +17

Band offset measurements of the Si3N4/GaN (0001) interface

T. E. Cook, C. C. Fulton, Will Mecouch et al. · Journal of Applied Physics · 2003 · 92 citations

Natural Sciences, Materials Engineering, Materials Science +17

<i>In situ</i> cleaning and characterization of oxygen- and zinc-terminated, <i>n</i>-type, ZnO{0001} surfaces

B. J. Coppa, C. C. Fulton, P. J. Hartlieb et al. · Journal of Applied Physics · 2004 · 88 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

Band offset measurements of the GaN (0001)/HfO2 interface

T. E. Cook, C. C. Fulton, Will Mecouch et al. · Journal of Applied Physics · 2003 · 72 citations

Engineering, Materials Engineering, Materials Science +17