C. C. Fulton

Structural, microstructural, and electrical properties of gold films and Schottky contacts on remote plasma-cleaned, n-type ZnO{0001} surfaces

B. J. Coppa, C. C. Fulton, Sharon Kiesel et al. · Journal of Applied Physics · 2005 · 135 citations

Materials Science, Surface Characterization, Surface Conductivity +15

Measurement of the band offsets of SiO2 on clean <i>n</i>- and <i>p</i>-type GaN(0001)

T. E. Cook, C. C. Fulton, Will Mecouch et al. · Journal of Applied Physics · 2003 · 100 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +12

Band offset measurements of the Si3N4/GaN (0001) interface

T. E. Cook, C. C. Fulton, Will Mecouch et al. · Journal of Applied Physics · 2003 · 91 citations

Materials Science, Semiconductors, Electrical Engineering +13

<i>In situ</i> cleaning and characterization of oxygen- and zinc-terminated, <i>n</i>-type, ZnO{0001} surfaces

B. J. Coppa, C. C. Fulton, P. J. Hartlieb et al. · Journal of Applied Physics · 2004 · 88 citations · Full text

Materials Science, Surface Characterization, Engineering +12

Band offset measurements of the GaN (0001)/HfO2 interface

T. E. Cook, C. C. Fulton, Will Mecouch et al. · Journal of Applied Physics · 2003 · 70 citations

Semiconductors, Oxide Heterostructures, Electrical Engineering +13