Y. Kamiura

The chemical composition changes of silicon and phosphorus in the process of native oxide formation of heavily phosphorus doped silicon

W.B. Ying, Yusuke Mizokawa, Y. Kamiura et al. · Applied Surface Science · 2001 · 49 citations

Natural Sciences, Materials Engineering, Materials Science +13

Evaluation of the initial oxidation of heavily phosphorus doped silicon surfaces using angle-dependent X-ray photoelectron spectroscopy

W.B. Ying, Yusuke Mizokawa, Katsuto Tanahashi et al. · Thin Solid Films · 1999 · 19 citations

Natural Sciences, Materials Engineering, Materials Science +16

Characterization of Polycrystalline Tungsten Surfaces Irradiated with Nitrogen Ions by X-ray Photoelectron Spectroscopy

Y. Kamiura, Kenji Umezawa, Yuden Teraoka et al. · MATERIALS TRANSACTIONS · 2016 · 15 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +15

Annealing behavior of phosphorus in native oxide films on heavily phosphorus doped silicon

W.B. Ying, Yusuke Mizokawa, Yaozhong Yu et al. · Applied Surface Science · 1996 · 14 citations

Engineering, Materials Engineering, Materials Science +12

Phosphorus redistribution in the surface region of heavily phosphorus doped silicon

Yusuke Mizokawa, W.B. Ying, Yaozhong Yu et al. · Applied Surface Science · 1996 · 13 citations

Engineering, Materials Engineering, Materials Science +14